آنالیز میکروسکوپی

آنالیز میکروسکوپی

مرکز خدمات آزمایشگاهی (آزمایشگاه مرکزی شریف)، در بخش آنالیز میکروسکوپی شریف دارای آنالیزهای زیر می‌باشد که در ادامه می‌توانید نسبت به بررسی و ثبت درخواست آزمون‌های مربوطه اقدام کنید:

  • آنالیز SEM (آزمون SEM)
  • آنالیز TEM (آزمون TEM)
  • آنالیز AFM (آزمون AFM)
  • آنالیز CLSM (آزمون CLSM)

آزمون میکروسکوپ الکترونی روبشی SEM

Scanning Electron Microscopy

آنالیز SEM
SEM Analysis: Scanning Electron Microscopy (SEM) generates a narrow electron beam and scans it across the sample surface, collecting data from the reflected rays to provide various types of information about the surface layers of the material. This information, depending on the detectors attached to the device, can be utilized in different categories. The SEM available in this laboratory is capable of imaging the topography and elemental structure of the surface, as well as performing quantitative analysis of the surface's chemical structure.
 
 
ثبت درخواست آزمون SEM

آزمون میکروسکوپ الکترونی نوری TEM

Transmission Electron Microscopes

آنالیز TEM
TEM Analysis: Transmission Electron Microscopy (TEM) at this laboratory provides the capability to examine the crystal structure and microstructure of various materials, including metals, ceramics, polymers, and composites. The electron microscopy equipment available in the laboratory enables the study of materials' microstructures (dimensions, morphology, and phase distribution and defects) with nanometer resolution, making it unique in the country. Additionally, the microanalysis equipment installed on the device allows for the study of the chemical composition of phases at the nanometer scale.
 
ثبت درخواست آزمون TEM

آزمون میکروسکوپ نیرو اتمی AFM

Atomic Force Microscopy 

آنالیز AFM
AFM Analysis: Atomic Force Microscopy (AFM) is a scanning microscope capable of imaging the surface topography of a sample. One of the additional applications of AFM analysis is measuring the thickness of nanometric coatings. This microscope can image all surfaces, including non-conductive surfaces, and operates in both contact and non-contact modes. Consequently, AFM analysis is an excellent technique for understanding the surface structure of nanostructured bulk samples such as membranes, thin films, and lithographed electronic components. The AFM used in this center is the FemtoScan model.
 
ثبت درخواست آزمون AFM

آزمون میکروسکوپ روبشی هم کانون لیزری

Confocal Laser Scanning Microscopy

آنالیز کانفوکال
CLSM Analysis: Confocal Laser Scanning Microscopy (CLSM) is capable of performing microscopy in both confocal and fluorescence modes. In fluorescence microscopy, the entire sample is excited with light passing through a specific color filter, and the emitted light forms the desired image similar to bright-field microscopy. In fluorescence microscopy, the resolution decreases due to the overlap of emitted light from different points. Confocal microscopy compensates for this reduced resolution; in this type of microscopy, the laser is focused on a specific small area of the sample. Using a specialized optical system, only the emitted light from that specific point is recorded by a photodiode, resulting in enhanced image resolution.
ثبت درخواست آزمون CLSM